Enhancement of VTH Degradation under NBT Stress due to Hole Capturing

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Translated title of the contribution	Enhancement of VTH Degradation under NBT Stress due to Hole Capturing
Original language	American English
Pages (from-to)	16 - 17
Journal	Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials
State	Published - Sep 2003

Cite this

@article{0820542f975d4dd4877a2d91a53a3450,

title = "Enhancement of VTH Degradation under NBT Stress due to Hole Capturing",

author = "\{MITANI Y.\} and Yuichiro MITANI",

year = "2003",

month = sep,

language = "American English",

pages = "16 -- 17",

journal = "Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials",

}

TY - JOUR

T1 - Enhancement of VTH Degradation under NBT Stress due to Hole Capturing

AU - MITANI Y., null

AU - MITANI, Yuichiro

PY - 2003/9

Y1 - 2003/9

M3 - Article

SP - 16

EP - 17

JO - Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials

JF - Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials

ER -