Si-fullerene compounds produced by controlling spatial structure of an arc-discharge plasma

T Hirata; N Motegi; R Hatakeyama; T Oku; T Mieno; N Sato; H Mase; M Niwano; N Miyamoto; N Sato; Takamichi HIRATA

doi:10.1143/jjap.39.L1130

Si-fullerene compounds produced by controlling spatial structure of an arc-discharge plasma

T Hirata
, N Motegi
, R Hatakeyama
, T Oku
, T Mieno
, N Sato
, H Mase
, M Niwano
, N Miyamoto
, N Sato
, Takamichi HIRATA

Department of Medical Engineering

Research output: Contribution to journal › Misc

Abstract

Silicon-fullerene compounds are produced in a modified fullerene generator, where a direct-current (DC) or a radiofrequency (RF) discharge is superimposed in the periphery region of an arc-discharge plasma. The soot mass analysis gives spectrum peaks corresponding to silicon-endohedral fullerenes Si@C-n, (n = 74, 86, etc.). The soot structure analyses with X-ray diffraction (XRD) and high-resolution electron microscopy (HREM) demonstrate that there exist nanoparticles with the fullerene size, which are considered to be Si@C-n, and carbon nanocapsules filled with SiC.

Translated title of the contribution	Si-fullerene compounds produced by controlling spatial structure of an arc-discharge plasma
Original language	American English
Pages (from-to)	L1130 - L1132
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	39
Issue number	11B
DOIs	https://doi.org/10.1143/jjap.39.L1130
State	Published - Nov 2000

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10.1143/jjap.39.L1130

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title = "Si-fullerene compounds produced by controlling spatial structure of an arc-discharge plasma",

abstract = "Silicon-fullerene compounds are produced in a modified fullerene generator, where a direct-current (DC) or a radiofrequency (RF) discharge is superimposed in the periphery region of an arc-discharge plasma. The soot mass analysis gives spectrum peaks corresponding to silicon-endohedral fullerenes Si@C-n, (n = 74, 86, etc.). The soot structure analyses with X-ray diffraction (XRD) and high-resolution electron microscopy (HREM) demonstrate that there exist nanoparticles with the fullerene size, which are considered to be Si@C-n, and carbon nanocapsules filled with SiC.",

author = "\{T Hirata\} and \{N Motegi\} and \{R Hatakeyama\} and \{T Oku\} and \{T Mieno\} and \{N Sato\} and \{H Mase\} and \{M Niwano\} and \{N Miyamoto\} and \{N Sato\} and Takamichi HIRATA",

year = "2000",

month = nov,

doi = "10.1143/jjap.39.L1130",

language = "American English",

volume = "39",

pages = "L1130 -- L1132",

journal = "Japanese Journal of Applied Physics, Part 2: Letters",

issn = "0021-4922",

publisher = "INST PURE APPLIED PHYSICS",

number = "11B",

}

TY - JOUR

T1 - Si-fullerene compounds produced by controlling spatial structure of an arc-discharge plasma

AU - T Hirata, null

AU - N Motegi, null

AU - R Hatakeyama, null

AU - T Oku, null

AU - T Mieno, null

AU - N Sato, null

AU - H Mase, null

AU - M Niwano, null

AU - N Miyamoto, null

AU - N Sato, null

AU - HIRATA, Takamichi

PY - 2000/11

Y1 - 2000/11

N2 - Silicon-fullerene compounds are produced in a modified fullerene generator, where a direct-current (DC) or a radiofrequency (RF) discharge is superimposed in the periphery region of an arc-discharge plasma. The soot mass analysis gives spectrum peaks corresponding to silicon-endohedral fullerenes Si@C-n, (n = 74, 86, etc.). The soot structure analyses with X-ray diffraction (XRD) and high-resolution electron microscopy (HREM) demonstrate that there exist nanoparticles with the fullerene size, which are considered to be Si@C-n, and carbon nanocapsules filled with SiC.

AB - Silicon-fullerene compounds are produced in a modified fullerene generator, where a direct-current (DC) or a radiofrequency (RF) discharge is superimposed in the periphery region of an arc-discharge plasma. The soot mass analysis gives spectrum peaks corresponding to silicon-endohedral fullerenes Si@C-n, (n = 74, 86, etc.). The soot structure analyses with X-ray diffraction (XRD) and high-resolution electron microscopy (HREM) demonstrate that there exist nanoparticles with the fullerene size, which are considered to be Si@C-n, and carbon nanocapsules filled with SiC.

U2 - 10.1143/jjap.39.L1130

DO - 10.1143/jjap.39.L1130

M3 - Misc

SN - 0021-4922

VL - 39

SP - L1130 - L1132

JO - Japanese Journal of Applied Physics, Part 2: Letters

JF - Japanese Journal of Applied Physics, Part 2: Letters

IS - 11B

ER -

Si-fullerene compounds produced by controlling spatial structure of an arc-discharge plasma

Abstract

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