SiGe/Si(110)ヘテロ構造の正孔移動度測定

Translated title of the contribution: SiGe/Si(110)ヘテロ構造の正孔移動度測定

小幡智幸, 古川洋志, 有元圭介, 山中淳二, 中川清和, Yusuke HOSHI, 澤野憲太郎, 白木靖寛

Research output: Contribution to journalMisc

Translated title of the contributionSiGe/Si(110)ヘテロ構造の正孔移動度測定
Original languageJapanese
Pages (from-to)ROMBUNNO.16A-F11-9 -
Journal応用物理学関係連合講演会講演予稿集(CD-ROM)
Volume59th
StatePublished - 29 Feb 2012

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