| Original language | Japanese |
|---|---|
| State | Published - 2006 |
| Event | conference - Duration: 1 Jan 2010 → … |
Conference
| Conference | conference |
|---|---|
| Period | 1/01/10 → … |
X-ray photoelectron spectroscopy study on dielectric properties at gate insulator film/Si interfaces
K. Hirose, H. Nohira, D. Kobayashi, T. Hattori, Hiroshi NOHIRA
Research output: Contribution to conference › Presentation